In situ EC-AFM study of the effect of nanocrystals on the passivation and pit initiation in an Al-based metallic glass

Corrosion Science

Volumn 83, Issue , 2014, Pages 111-123

  Zhang, S D ^a   Liu, Z W ^b   Wang, Z M ^c   Wang, J Q ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

^b AGILENT TECHNOLOGIES   (China)

^c SINOPEC   (China)

Author keywords

A. Aluminium; A. Glass; B. AFM; B. XPS; C. Passivity; C. Pitting corrosion

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; LEAD ACID BATTERIES; METALLIC GLASS; NANOCRYSTALS; PITTING;

AFM; AL-BASED METALLIC GLASS; AL-NANOPARTICLES; AMORPHOUS MATRICES; C. PASSIVITY; CORROSION PRODUCTS; GALVANIC COUPLING; LOCAL STRUCTURE;

ALUMINUM;

EID: 84897115681     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2014.02.005     Document Type: Article

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