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Volumn 89, Issue 12, 2014, Pages

Probing the electronic states of high-TMR off-stoichiometric Co 2 MnSi thin films by hard x-ray photoelectron spectroscopy

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EID: 84896938264     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.125116     Document Type: Article
Times cited : (29)

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