A comprehensive framework for counterfeit defect coverage analysis and detection assessment

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 30, Issue 1, 2014, Pages 25-40

  Guin, Ujjwal ^a   Dimase, Daniel ^b   Tehranipoor, Mohammad ^a  

^a University of Connecticut   (United States)

^b HONEYWELL   (United States)

Author keywords

Assessment; Counterfeit IC; Defect coverage; Detection methods

Indexed keywords

BUILT-IN SELF TEST; CLONING; DEFECTS; STANDARDS; SUPPLY CHAINS; TAXONOMIES;

ASSESSMENT; COUNTERFEIT ELECTRONIC COMPONENTS; DEFECT COVERAGE; DEFECT COVERAGE ANALYSIS; DETECTION METHODS; TEST COST; TEST TIME;

CRIME;

EID: 84896491283     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-013-5428-2     Document Type: Article

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