Identification of recovered ICs using fingerprints from a light-weight on-chip sensor

Proceedings - Design Automation Conference

Volumn , Issue , 2012, Pages 703-708

  Zhang, Xuehui ^a   Tuzzio, Nicholas ^a   Tehranipoor, Mohammad ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

circuit aging; counterfeiting; hardware security; recovered ICs

Indexed keywords

CIRCUIT AGING; COUNTERFEITING; CRITICAL APPLICATIONS; ELECTRONIC SYSTEMS; HARDWARE SECURITY; IDENTICAL FUNCTIONALITIES; LIGHT WEIGHT; ON-CHIP SENSORS; RECOVERED ICS; STATISTICAL DATA ANALYSIS; TEMPERATURE VARIATION; TEST CHIPS;

COMPUTER AIDED DESIGN; MILITARY APPLICATIONS; RECOVERY;

SENSORS;

EID: 84863542879     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2228360.2228486     Document Type: Conference Paper

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