Path-delay fingerprinting for identification of recovered ICs

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2012, Pages 13-18

  Zhang, Xuehui ^a   Xiao, Kan ^a   Tehranipoor, Mohammad ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

45NM TECHNOLOGY; AGING EFFECTS; BENCHMARK CIRCUIT; ELECTRONIC SYSTEMS; FINGERPRINTING TECHNIQUES; PATH DELAY; PROCESS VARIATION; STATISTICAL DATA ANALYSIS;

CRIME; DEFECTS; FAULT TOLERANCE; NANOTECHNOLOGY;

RECOVERY;

EID: 84872347934     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2012.6378192     Document Type: Conference Paper

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