Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis

Powder Diffraction

Volumn 29, Issue 1, 2014, Pages 76-84

  Lutterotti, Luca ^a   Vasin, Roman ^b,c   Wenk, Hans Rudolf ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

Author keywords

diffraction images; Rietveld method; synchrotron diffraction; texture analysis

Indexed keywords

DIFFRACTION IMAGES; SYNCHROTRON DIFFRACTION; TEXTURE ANALYSIS;

RIETVELD METHOD;

EID: 84894452633     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715613001346     Document Type: Article

References (28)

1. Battocchio, F., Monteiro, P. J. M., and Wenk, H.-R. (2012). Rietveld refinement of the structures of 1.0 C-S-H and 1.5 C-S-H, Cem. Concr. Res. 42, 1534-1548
2. Chantler, C. T., Tran, C. Q., and Cookson, D. J. (2004). Precise measurement of the lattice spacing of LaB6 standard powder by the x-ray extended range technique using synchrotron radiation, Phys. Rev. A 69, 1-11
3. De Keijser, Th. H., Langford, J. I., Mittemeijer, E. J., and Vogels, A. B. P. (1982). Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening, J. Appl. Crystallogr. 15, 308-314
4. Delhez, R., de Keijser, Th. H., Langford, J. I., Louër, D., Mittemeijer, E. J., and Sonneveld, E. J. (1993). Crystal imperfection broadening and peak shape in the Rietveld method in The Rietveld Method edited by R. A. Young (Oxford University Press, Oxford, UK), pp. 132-166
5. Grässlin, J., McCusker, L. B., Baerlocher, C., Gozzo, F., Schmitt, B., and Lutterotti, L. (2013). Advances in exploiting preferred orientation in the structure analysis of polycrystalline materials, J. Appl. Crystallogr. 46, 173-180
6. Hammersley, A. P. (1998). Fit2D: V99.129 Reference Manual Version 3.1. Internal Report ESRF -98 -HA01
7. Kocks, U. F., Tomé, C. N., and Wenk, H-R. (2000). Texture and Anisotropy: Preferred Orientations in Polycrystals and their Effect on Materials Properties (Cambridge University Press, Cambridge), 2nd ed., p. 677
8. Larson, A. C. and Von Dreele, R. B. (2004). General Structure Analysis System (GSAS) (Report LAUR 86-748). Los Alamos, New Mexico: Los Alamos National Laboratory
9. Le Bail, A., Duroy, H., and Fourquet, J. L. (1988). Ab-initio structure determination of LiSbWO6 by X-ray powder diffraction, Mater. Res. Bull. 23, 447-452
10. Lonardelli, I., Wenk, H.-R., Lutterotti, L., and Goodwin, M. (2005). Texture analysis from synchrotron diffraction images with the Rietveld method: Dinosaur tendon and salmon scale, J. Synchrotr. Radiat. 12, 354-360
11. Lutterotti, L. (2010). Total pattern fitting for the combined size-strain-stress-Texture determination in thin film diffraction, Nucl. Instrum. Methods Phys. Res. B 268, 334-340
12. Lutterotti, L. and Bortolotti, M. (2005). Algorithms for solving crystal structure using texture, Acta Crystallogr. A61, C158-C159
13. Lutterotti, L., Matthies, S.,Wenk, H.-R., Schultz, A. S., and Richardson, J.W. (1997). Combined texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra, J. Appl. Phys. 81, 594-600
14. Lutterotti, L., Chateigner, D., Ferrari, S., and Ricote, J. (2004). Texture, residual stress and structural analysis of thin films using a combined X-ray analysis, Thin Solid Films 450, 34-41
15. Matthies, S. and Vinel, G. W. (1982). On the reproduction of the orientation distribution function of texturized samples from reduced pole figures using the conception of a conditional ghost correction, Phys. Status Solidi b 112, K111-K114
16. Pawlik, K. (1986). Determination of the orientation distribution function from pole figures in arbitrarily defined cells, Phys. Status Solidi b 134, 477-483
17. Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures, J. Appl. Crystallogr. 2, 65-71
18. Schmidt, U. and Lücke, K. (1979). Recrystallization textures of silver, copper and a-brasses with different zinc-contents as a function of the rolling temperature, Texture Cryst. Solids 3, 85-112
19. SRM660b (2010).Lanthanum HexaboridePowder LinePosition and Line Shape Standard for Powder Diffraction (National Institute of Standards and Technology; US Department of Commerce, Gaithersburg, MD), pp. 1-5
20. SRM 674b (2012). Cerium Oxide (Quantitative Powder Diffraction Standard) (National Institute of Standards and Technology; US Department of Commerce, Gaithersburg, MD), pp. 1-5
21. Toby, B. H. (2006). R factors in Rietveld analysis: How good is good enough? Powder Diffr. 21, 67-70
22. Vogel, S. C., Hartig, C., Lutterotti, L., Von Dreele, R. B., Wenk, H.-R., and Williams, D. J. (2004). Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method. Powder Diffr. 19, 65-68
23. Von Dreele, R. B. (1997). Quantitative texture analysis by Rietveld refinement, J. Appl. Crystallogr. 30, 517-525
24. Wenk, H.-R., Matthies, S., Donovan, J., and Chateigner, D. (1998). BEARTEX: A windows-based program system for quantitative texture analysis, J. Appl. Crystallogr. 31, 262-269
25. Wenk, H.-R., Lutterotti, L., and Vogel, S. C. (2010). Rietveld texture analysis from TOF neutron diffraction data, Powder Diffr. 25, 283-296
26. Wenk, H.-R., Vasin, R. N.,Kern,H.,Matthies, S.,Vogel, S.C., and Ivankina, T. I. (2012). Revisiting elastic anisotropy of biotite gneiss from the Outokumpu scientific drill hole based on new texture measurements and texture-based velocity calculations, Tectonophysics 570-571, 123-134
27. Wenk, H.-R., Kaercher, P., Kanitpanyacharoen, W., Lutterotti, L., Miyagi, L., and Vasin, R. N. (2014). Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments, Powder Diffr. (in press
28. Yashima, M., Ishimura, D., Yamaguchi, Y., Ohoyama, K., and Kawachi, K. (2003). High-Temperature neutron powder diffraction study of cerium dioxide CeO2 up to 1770 K, Chem. Phys. Lett. 372, 784-787