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Volumn 25, Issue 3, 2010, Pages 283-296

Rietveld texture analysis from TOF neutron diffraction data

Author keywords

Neutron diffraction; Quartzite; Rietveld method; Texture analysis

Indexed keywords

ELECTRON BACK SCATTER DIFFRACTION; EXPERIMENTAL METHODS; PREFERRED ORIENTATIONS; QUARTZITE; STEP BY STEP PROCEDURE; TEXTURE ANALYSIS; TIME-OF-FLIGHT DIFFRACTOMETERS; TOF NEUTRON DIFFRACTION;

EID: 77956921805     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.3479004     Document Type: Article
Times cited : (169)

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