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Volumn 10, Issue 1, 2014, Pages 15-22

Accelerated test planning with independent competing risks and concave degradation path

Author keywords

Accelerated tests; Competing risks; Degradation process; Intensity function; Tempered failure rate model

Indexed keywords

FAILURE RATE;

EID: 84894189681     PISSN: 09731318     EISSN: 29938341     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (10)
  • 1
    • 2942675185 scopus 로고    scopus 로고
    • Statistical analysis of linear degradation and failure time data with multiple failure modes
    • DOI 10.1023/B:LIDA.0000019256.59372.63
    • Bagdonaviçius, V., A. Bikelis, and V. Kazakevicius. Statistical Analysis of Linear Degradation and Failure Time Data With Multiple Failure Modes. Lifetime Data Analysis, 2004; 10(1): 65-81. (Pubitemid 39025643)
    • (2004) Lifetime Data Analysis , vol.10 , Issue.1 , pp. 65-81
    • Bagdonavicius, V.1    Bikelis, A.2    Kazakevicius, V.3
  • 2
    • 24144502502 scopus 로고    scopus 로고
    • Statistical analysis of general degradation path model and failure time data with multiple failure modes
    • DOI 10.1081/STA-200063246
    • Bagdonaviçius, V., F. Haghighi, and M. Nikulin. Statistical Analysis of General Degradation Path Model and Failure Time Data With Multiple Failure Modes. Communications in Statistics- Theory and Methods, 2005; 34(8): 1771-1791. (Pubitemid 41228688)
    • (2005) Communications in Statistics - Theory and Methods , vol.34 , Issue.8 , pp. 1771-1791
    • Bagdonavicius, V.1    Haghighi, F.2    Nikulin, M.3
  • 6
    • 82455187926 scopus 로고    scopus 로고
    • Modeling and planning of step-stress accelerated life tests with independent competing risks
    • Liu, X., and W.S. Qiu. Modeling and planning of step-stress accelerated life tests with independent competing risks. IEEE Transactions on Reliability, 2011; 60(4): 712-720.
    • (2011) IEEE Transactions on Reliability , vol.60 , Issue.4 , pp. 712-720
    • Liu, X.1    Qiu, W.S.2
  • 7
    • 77949264195 scopus 로고    scopus 로고
    • Accelerated life test plans for repairable system with multiple independent risks
    • Liu, X., and L.C. Tang. Accelerated life test plans for repairable system with multiple independent risks. IEEE Transactions on Reliability, 2010; 59(1): 115-127.
    • (2010) IEEE Transactions on Reliability , vol.59 , Issue.1 , pp. 115-127
    • Liu, X.1    Tang, L.C.2
  • 8
    • 34047189210 scopus 로고    scopus 로고
    • Accelerated life test planning with independent weibull competing risks with known shape parameter
    • Pascal, F. Accelerated life test planning with independent weibull competing risks with known shape parameter. IEEE Transactions on Reliability, 2007; 56(1): 85-93.
    • (2007) IEEE Transactions on Reliability , vol.56 , Issue.1 , pp. 85-93
    • Pascal, F.1
  • 9
    • 51449090740 scopus 로고    scopus 로고
    • Accelerated life test planning with independent weibull competing risks
    • Pascal, F. Accelerated life test planning with independent weibull competing risks. IEEE Transactions on Reliability, 2008; 57(3): 435-444.
    • (2008) IEEE Transactions on Reliability , vol.57 , Issue.3 , pp. 435-444
    • Pascal, F.1
  • 10
    • 71649089278 scopus 로고    scopus 로고
    • Accelerated life test planning with independent lognormal competing risks
    • Pascal, F. Accelerated life test planning with independent lognormal competing risks. Journal of Statistical Planning and Inference, 2010; 140(4): 1089-1100.
    • (2010) Journal of Statistical Planning and Inference , vol.140 , Issue.4 , pp. 1089-1100
    • Pascal, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.