PROPTEST: A property based test pattern generator for sequential circuits using test compaction

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 653-659

  Guo, Ruifeng ^a   Reddy, Sudhakar M ^a   Pomeranz, Irith ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTRON DEVICE TESTING;

PROPERTY BASED TEST PATTERN GENERATION; TEST COMPACTION;

SEQUENTIAL CIRCUITS;

EID: 0032638542     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (26)