Entropy-based test generation for improved fault localization

2013 28th IEEE/ACM International Conference on Automated Software Engineering, ASE 2013 - Proceedings

Volumn , Issue , 2013, Pages 257-267

  Campos, Jose ^a   Abreu, Rui ^a   Fraser, Gordon ^b   D'Amorim, Marcelo ^c  

^a UNIVERSITY OF PORTO   (Portugal)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

^c FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

Author keywords

Fault localization; Test case generation

Indexed keywords

BAYESIAN REASONING; DIAGNOSTIC QUALITY; ENTROPY-BASED; FAULT LOCALIZATION; FITNESS FUNCTIONS; PROBABILITY THEORY; TEST CASE GENERATION; TEST GENERATIONS;

ENTROPY; SOFTWARE ENGINEERING;

STATISTICAL TESTS;

EID: 84893528180     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASE.2013.6693085     Document Type: Conference Paper

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