A two-step hierarchical algorithm for model-based diagnosis

Proceedings of the National Conference on Artificial Intelligence

Volumn 1, Issue , 2006, Pages 827-833

  Feldman, Alexander ^a   Van Gemund, Arjan ^a  

^a Department of Microelectronics   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; DIAGNOSIS; MATHEMATICAL INSTRUMENTS; PROBLEM SOLVING;

HIERARCHICAL ALGORITHMS; MODEL-BASED DIAGNOSIS; NON-OPTIMALLY PARTITIONED PROBLEMS; WEAK-FAULT MODELS;

HIERARCHICAL SYSTEMS;

EID: 33750713077     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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