-
1
-
-
71749095111
-
A practical evaluation of spectrum-based fault localization
-
R. Abreu, P. Zoeteweij, R. Golsteijn, and A. J. C. van Gemund. A practical evaluation of spectrum-based fault localization. Journal of Systems and Software, 82(11):1780-1792, 2009.
-
(2009)
Journal of Systems and Software
, vol.82
, Issue.11
, pp. 1780-1792
-
-
Abreu, R.1
Zoeteweij, P.2
Golsteijn, R.3
Van Gemund, A.J.C.4
-
6
-
-
57449100163
-
The probabilistic program dependence graph and its application to fault diagnosis
-
G. K. Baah, A. Podgurski, and M. J. Harrold. The probabilistic program dependence graph and its application to fault diagnosis. In Proc. ISSTA'08.
-
Proc. ISSTA'08
-
-
Baah, G.K.1
Podgurski, A.2
Harrold, M.J.3
-
8
-
-
0036994888
-
Intelligent probing: A cost-effective approach to fault diagnosis in computer networks
-
M. Brodie, I. Rish, and S. Ma. Intelligent probing: a cost-effective approach to fault diagnosis in computer networks. IBM Syst. J., 41:372-385, 2002.
-
(2002)
IBM Syst. J.
, vol.41
, pp. 372-385
-
-
Brodie, M.1
Rish, I.2
Ma, S.3
-
9
-
-
68949214345
-
Recomputing coverage information to assist regression testing
-
P. K. Chittimalli and M. J. Harrold. Recomputing coverage information to assist regression testing. IEEE Trans. Softw. Eng., 35(4):452-469, 2009.
-
(2009)
IEEE Trans. Softw. Eng.
, vol.35
, Issue.4
, pp. 452-469
-
-
Chittimalli, P.K.1
Harrold, M.J.2
-
10
-
-
85077480635
-
Diagnosing multiple persistent and intermittent faults
-
J. de Kleer. Diagnosing multiple persistent and intermittent faults. In Proc. IJCAI'09.
-
Proc. IJCAI'09
-
-
De Kleer, J.1
-
12
-
-
26044480846
-
Supporting controlled experimentation with testing techniques: An infrastructure and its potential impact
-
H. Do, S. G. Elbaum, and G. Rothermel. Supporting controlled experimentation with testing techniques: An infrastructure and its potential impact. Emp. Soft. Eng. J., 10(4), 2005.
-
(2005)
Emp. Soft. Eng. J.
, vol.10
, Issue.4
-
-
Do, H.1
Elbaum, S.G.2
Rothermel, G.3
-
13
-
-
0035017874
-
Incorporating varying test costs and fault severities into test case prioritization
-
S. Elbaum, A. Malishevsky, and G. Rothermel. Incorporating varying test costs and fault severities into test case prioritization. In Proc. ICSE'01.
-
Proc. ICSE'01
-
-
Elbaum, S.1
Malishevsky, A.2
Rothermel, G.3
-
15
-
-
0036472965
-
Test case prioritization: A family of empirical studies
-
S. G. Elbaum, A. G. Malishevsky, and G. Rothermel. Test case prioritization: A family of empirical studies. IEEE TSE, 28(2), 2002.
-
(2002)
IEEE TSE
, vol.28
, Issue.2
-
-
Elbaum, S.G.1
Malishevsky, A.G.2
Rothermel, G.3
-
19
-
-
80052074943
-
Prioritizing tests for software fault localization
-
Accepted for publication
-
A. Gonzalez-Sanchez, E. Piel, R. Abreu, H.-G. Gross, and A. J. van Gemund. Prioritizing tests for software fault localization. Software: Practice and Experience, 2011. Accepted for publication.
-
(2011)
Software: Practice and Experience
-
-
Gonzalez-Sanchez, A.1
Piel, E.2
Abreu, R.3
Gross, H.-G.4
Van Gemund, A.J.5
-
20
-
-
33646924305
-
Eliminating harmful redundancy for testing-based fault localization using test suite reduction: An experimental study
-
D. Hao, L. Zhang, H. Zhong, H. Mei, and J. Sun. Eliminating harmful redundancy for testing-based fault localization using test suite reduction: An experimental study. In Proc. ICSM'05.
-
Proc. ICSM'05
-
-
Hao, D.1
Zhang, L.2
Zhong, H.3
Mei, H.4
Sun, J.5
-
21
-
-
0027625420
-
A methodology for controlling the size of a test suite
-
M. J. Harrold, R. Gupta, and M. L. Soffa. A methodology for controlling the size of a test suite. ACM TSEM, 2(3), 1993.
-
(1993)
ACM TSEM
, vol.2
, Issue.3
-
-
Harrold, M.J.1
Gupta, R.2
Soffa, M.L.3
-
22
-
-
0028166441
-
Experiments of the effectiveness of dataflow- and controlflow-based test adequacy criteria
-
M. Hutchins, H. Foster, T. Goradia, and T. Ostrand. Experiments of the effectiveness of dataflow- and controlflow-based test adequacy criteria. In Proc. ICSE '94.
-
Proc. ICSE '94
-
-
Hutchins, M.1
Foster, H.2
Goradia, T.3
Ostrand, T.4
-
25
-
-
80051605306
-
How well do test case prioritization techniques support statistical fault localization
-
B. Jiang, Z. Zhang, T. H. Tse, and T. Y. Chen. How well do test case prioritization techniques support statistical fault localization. In Proc. COMPSAC'09.
-
Proc. COMPSAC'09
-
-
Jiang, B.1
Zhang, Z.2
Tse, T.H.3
Chen, T.Y.4
-
26
-
-
0036040176
-
Visualization of test information to assist fault localization
-
J. A. Jones, M. J. Harrold, and J. Stasko. Visualization of test information to assist fault localization. In Proc. ICSE'02.
-
Proc. ICSE'02
-
-
Jones, J.A.1
Harrold, M.J.2
Stasko, J.3
-
27
-
-
42549094431
-
Classifying software changes: Clean or buggy?
-
march-april
-
S. Kim, E. Whitehead, and Y. Zhang. Classifying software changes: Clean or buggy? IEEE TSE, 34(2):181 -196, march-april 2008.
-
(2008)
IEEE TSE
, vol.34
, Issue.2
, pp. 181-196
-
-
Kim, S.1
Whitehead, E.2
Zhang, Y.3
-
28
-
-
34047189734
-
Search algorithms for regression test case prioritization
-
Z. Li, M. Harman, and R. M. Hierons. Search algorithms for regression test case prioritization. IEEE TSE, 33(4), 2007.
-
(2007)
IEEE TSE
, vol.33
, Issue.4
-
-
Li, Z.1
Harman, M.2
Hierons, R.M.3
-
29
-
-
79959303728
-
Cooperative debugging with five hundred million test cases
-
B. Liblit. Cooperative debugging with five hundred million test cases. In Proc. ISSTA'08.
-
Proc. ISSTA'08
-
-
Liblit, B.1
-
31
-
-
56249107749
-
Evaluating models for model-based debugging
-
W. Mayer and M. Stumptner. Evaluating models for model-based debugging. In ASE'08.
-
ASE'08
-
-
Mayer, W.1
Stumptner, M.2
-
32
-
-
0030121550
-
An Experimental Determination of Sufficient Mutant Operators
-
A. J. Offutt, A. Lee, G. Rothermel, R. H. Untch, and C. Zapf. An experimental determination of sufficient mutant operators. ACM TOSEM, 5:99-118, April 1996. (Pubitemid 126418670)
-
(1996)
ACM Transactions on Software Engineering and Methodology
, vol.5
, Issue.2
, pp. 99-118
-
-
Offutt, A.J.1
Lee, A.2
Rothermel, G.3
Untch, R.H.4
Zapf, C.5
-
33
-
-
0032648910
-
Test sequencing algorithms with unreliable tests
-
V. Raghavan, M. Shakeri, and K. R. Pattipati. Test sequencing algorithms with unreliable tests. IEEE TSMC, 29(4), 1999.
-
(1999)
IEEE TSMC
, vol.29
, Issue.4
-
-
Raghavan, V.1
Shakeri, M.2
Pattipati, K.R.3
-
34
-
-
11144244572
-
Fault localization with nearest neighbor queries
-
M. Renieris and S. P. Reiss. Fault localization with nearest neighbor queries. In Proc. ASE'03.
-
Proc. ASE'03
-
-
Renieris, M.1
Reiss, S.P.2
-
35
-
-
0035481183
-
Prioritizing test cases for regression testing
-
G. Rothermel, R. H. Untch, C. Chu, and M. J. Harrold. Prioritizing test cases for regression testing. IEEE TSE, 27(10), 2001.
-
(2001)
IEEE TSE
, vol.27
, Issue.10
-
-
Rothermel, G.1
Untch, R.H.2
Chu, C.3
Harrold, M.J.4
-
38
-
-
72949091655
-
An empirical study of incorporating cost into test suite reduction and prioritization
-
A. M. Smith and G. M. Kapfhammer. An empirical study of incorporating cost into test suite reduction and prioritization. In Proc. SAC'09.
-
Proc. SAC'09
-
-
Smith, A.M.1
Kapfhammer, G.M.2
-
39
-
-
0024750674
-
Ambiguity groups and testability
-
Oct.
-
G. Stenbakken, T. Souders, and G. Stewart. Ambiguity groups and testability. IEEE Trans. on Instr. and Meas., 38(5):941 -947, Oct. 1989.
-
(1989)
IEEE Trans. on Instr. and Meas.
, vol.38
, Issue.5
, pp. 941-947
-
-
Stenbakken, G.1
Souders, T.2
Stewart, G.3
-
40
-
-
0026901308
-
Pie: A dynamic failure-based technique
-
J. M. Voas. Pie: A dynamic failure-based technique. IEEE TSE, 18(8):717-727, 1992.
-
(1992)
IEEE TSE
, vol.18
, Issue.8
, pp. 717-727
-
-
Voas, J.M.1
-
41
-
-
69749107742
-
Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization
-
X. Wang, S. Cheung, W. Chan, and Z. Zhang. Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization. In Proc. ICSE'09.
-
Proc. ICSE'09
-
-
Wang, X.1
Cheung, S.2
Chan, W.3
Zhang, Z.4
-
42
-
-
50649111409
-
A crosstab-based statistical method for effective fault localization
-
W. Wong, T. Wei, Y. Qi, and L. Zhao. A crosstab-based statistical method for effective fault localization. In Proc. ICST'08.
-
Proc. ICST'08
-
-
Wong, W.1
Wei, T.2
Qi, Y.3
Zhao, L.4
-
44
-
-
57349154284
-
An empirical study of the effects of test-suite reduction on fault localization
-
Y. Yu, J. A. Jones, and M. J. Harrold. An empirical study of the effects of test-suite reduction on fault localization. In Proc. ICSE'08.
-
Proc. ICSE'08
-
-
Yu, Y.1
Jones, J.A.2
Harrold, M.J.3
|