Defect oriented fault analysis for SRAM

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 256-261

  Huang, Rei Fu ^a   Chou, Yung Fa ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

PROGRAM DIAGNOSTICS; RANDOM ACCESS STORAGE; SEMICONDUCTOR STORAGE; STATIC RANDOM ACCESS STORAGE;

DATA RETENTION FAULTS; DEFECT INJECTIONS; FAULT ANALYSIS; MEMORY CELL ARRAYS; SEMICONDUCTOR MEMORY; STUCK-AT FAULTS; TEMPERATURE PARAMETERS; TRANSITION FAULTS;

DEFECTS;

EID: 84893436776     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250819     Document Type: Conference Paper

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