Partial decoupling between strain and polarization in mono-oriented Pb (Zr0.2 Ti0.8) O3 thin film

Applied Physics Letters

Volumn 90, Issue 21, 2007, Pages

  Janolin, Pierre Eymeric ^a   Fraisse, Bernard ^a   Le Marrec, Fraņoise ^b   Dkhil, Brahim ^a  

^a LABORATOIRE STRUCTURES   (France)

^b Pôle Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; LATTICE CONSTANTS; LEAD; PHASE DIAGRAMS; POLARIZATION; STRAIN; X RAY DIFFRACTION;

MISFIT STRAIN; TEMPERATURE EVOLUTION; TETRAGONALITY;

THIN FILMS;

EID: 34249749479     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2742313     Document Type: Article

References (26)

1. J. Frantti, S. Ivanov, S. Eriksson, H. Rundlöf, V. Lantto, J. Lappalainen, and M. Kakihana, Phys. Rev. B 66, 064108 (2002).
2. D. E. Cox, B. Noheda, and G. Shirane, Phys. Rev. B 71, 134110 (2005).
3. R. Ranjan, A. K. Singh, Ragini, and D. Pandey, Phys. Rev. B 71, 092101 (2005).
4. I. A. Kornev, L. Bellaiche, P. E. Janolin, B. Dkhil, and E. Suard, Phys. Rev. Lett. 97, 157601 (2006).
5. A. Sani, B. Noheda, I. Kornev, L. Bellaiche, P. Bouvier, and J. Kreisel, Phys. Rev. B 69, 020105 (2004).
6. I. A. Kornev, L. Bellaiche, P. Bouvier, P. E. Janolin, B. Dkhil, and J. Kreisel, Phys. Rev. Lett. 95, 196804 (2005).
7. P. E. Janolin, B. Dkhil, P. Bouvier, J. Kreisel, and P. A. Thomas, Phys. Rev. B 73, 094128 (2006).
8. K. Choi, M. Biegalski, Y. Li, A. Sharan, J. Schubert, R. Uecker, P. Reiche, Y. Chen, X. Pan, V. Gopalan, L.-Q. Chen, D. Scholm, and C. Eom, Science 306, 1005 (2004).
9. Y. L. Li and L. Q. Chen, Appl. Phys. Lett. 88, 072905 (2006).
10. I. B. Misirlioglu, S. P. Alpay, F. He, and B. O. Wells, J. Appl. Phys. 99, 104103 (2006).
11. F. He, B. Wells, Z.-G. Ban, S. Alpay, S. Grenier, S. Shapiro, W. Si, A. Clark, and X. Xi, Phys. Rev. B 70, 235405 (2004).
12. F. He, B. Wells, and S. Shapiro, Phys. Rev. Lett. 94, 176101 (2005).
13. J. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, Y. Li, S. Choudhury, W. Tian, M. Hawley, B. Craigo, A. Tagantsev, X. Pan, S. Streiffer, L. Chen, S. Kirchoefer, J. Levy, and D. Schlom, Nature (London) 430, 758 (2004).
14. S. P. Keane, S. Schmidt, J. Lu, A. E. Romanov, and S. Stemmer, J. Appl. Phys. 99, 033521 (2006).
15. S. Rios, J. F. Scott, A. Lookman, J. McAneney, R. M. Bowman, and J. M. Gregg, J. Appl. Phys. 99, 024107 (2006).
16. B. Dkhil, E. Defay, and J. Guillan, Appl. Phys. Lett. 90, 022908 (2007).
17. N. Pertsev, V. Kukhar, H. Kohlstedt, and R. Waser, Phys. Rev. B 67, 054107 (2003).
18. S. Alpay and A. Roytburd, J. Appl. Phys. 83, 4714 (1998).
19. J. Speck and W. Pompe, J. Appl. Phys. 76, 466 (1994).
20. We have used Y=122 GPa and =0.36 in our calculations.
21. P.-E. Janolin, F. Le Marrec, J. Chevreul, and B. Dkhil, Appl. Phys. Lett. 90, 192910 (2007).
22. J. S. Speck, A. Seifert, W. Pompe, and R. Ramesh, J. Appl. Phys. 76, 477 (1994).
23. P. Paruch and J. M. Triscone, Appl. Phys. Lett. 88, 162907 (2006).
24. H. Morioka, S. Yokoyama, T. Oikawa, H. Funakubo, and K. Saito, Appl. Phys. Lett. 85, 3516 (2004).
25. B. Tuttle, J. A. Voigt, D. C. Goodnow, D. L. Lamppa, T. J. Headley, M. O. Eatough, G. Zender, R. D. Nasby, and S. M. Rodgers, J. Am. Ceram. Soc. 76, 1537 (1993).
26. G. Brennecka, W. Huebner, B. Tuttle, and P. Clem, J. Am. Ceram. Soc. 87, 1459 (2004).