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Volumn 2, Issue 6, 2014, Pages 1158-1164
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Current rectification by a single ZnS nanorod probed using a scanning tunneling microscopic technique
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLIED BIAS VOLTAGE;
CURRENT RECTIFICATIONS;
DISCRETE ENERGY LEVELS;
FOWLER-NORDHEIM TUNNELING;
MICROSCOPIC TECHNIQUES;
MINIATURIZED DEVICES;
RECTIFICATION BEHAVIOR;
RECTIFICATION PROPERTIES;
BIAS VOLTAGE;
ELECTRIC RECTIFIERS;
ZINC SULFIDE;
NANORODS;
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EID: 84892700504
PISSN: 20507534
EISSN: 20507526
Source Type: Journal
DOI: 10.1039/c3tc31850h Document Type: Article |
Times cited : (10)
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References (38)
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