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Volumn 2, Issue 6, 2014, Pages 1158-1164

Current rectification by a single ZnS nanorod probed using a scanning tunneling microscopic technique

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS VOLTAGE; CURRENT RECTIFICATIONS; DISCRETE ENERGY LEVELS; FOWLER-NORDHEIM TUNNELING; MICROSCOPIC TECHNIQUES; MINIATURIZED DEVICES; RECTIFICATION BEHAVIOR; RECTIFICATION PROPERTIES;

EID: 84892700504     PISSN: 20507534     EISSN: 20507526     Source Type: Journal    
DOI: 10.1039/c3tc31850h     Document Type: Article
Times cited : (10)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.