Time dependent polarization and strain evolution around a circular hole in ferroelectrics

ASME 2012 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, SMASIS 2012

Volumn 2, Issue , 2012, Pages 47-52

  Liu, Q D ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE MEASUREMENTS; ELECTRIC DISPLACEMENT; ELECTRIC FIELD MAGNITUDE; FIELD CONCENTRATIONS; LOCAL ELECTRIC FIELD; POLARIZATION AND STRAINS; REMNANT POLARIZATIONS; TIME-DEPENDENT FIELDS;

BIREFRINGENCE; CREEP; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; INTELLIGENT MATERIALS; INTELLIGENT SYSTEMS; POLARIZATION; PROCESS CONTROL; STRAIN;

HOLE CONCENTRATION;

EID: 84892667667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/SMASIS2012-7949     Document Type: Conference Paper

References (12)

1. st edition.
2. Scott, J.F., 1998, "The physics of ferroelectric ceramic thin films for memory applications," Ferroelectrics Rev. 1, pp. 1-129.
3. Setter, N., 2001, "Electroceramics: looking ahead," J. Europ. Ceram. Soc, 21, pp. 1279-1293.
4. Croft, D., Shed, G, and Devasia, S., 2001, "Creep, hysteresis, and vibration compensation for piezoactuaors: Atomic force microscopy application," J. Dyn. Syst. Meas. & Control, 123, pp. 35-43.
5. Belov, A.Y. and Kreher, W.S., 2009, "Creep in Soft PZT The Effect of Internal Fields," Ferroelectrics, 391: 12-21.
6. Lapchuk, A., Yun, S.K., An, S.D., Song, J., Yurlov, V, Bourim, E., Yang, H., and Park, H.W., 2011, "Creep compensation method in a thin film PZT structure for a spatial optical modulator," Sensors and Actuators A: Physical 167(2), pp. 406-415.
7. Huber, J.E. and Fleck, N.A., 2004, "Ferroelectric switching: a micromechanics model versus measured behaviour," Europ. J. Mech. - A/Solids, 23, pp. 203-217.
8. Pane, I., Fleck, N.A., Huber, J.E., and Chu, D.P., 2008, "Effect of geometry upon the performance of a thin film ferroelectric capacitor," Int. J. Solids & Struct., 45, pp. 2024-2041.
9. Liu Q.D., Fleck, N.A., Chu, D.P, and Huber, J.E., 2009, "Birefringence measurements of creep near an electrode tip in transparent PLZT," J. Europ. Ceram. Soc, 29, pp. 2289-2296.
10. Liu, Q.D., and Huber, J.E., 2012, "Electrical creep around a circular hole in PLZT 8/65/35," J. Europ. Ceram. Soc, 32, pp. 195-202.
11. Liu, Q.D., and Huber, J.E., 2006, "Creep in ferroelectrics due to unipolar electrical loading," J. Europ. Ceram. Soc., 29, pp. 2799-2806.
12. Dai, L.C., Guo, W.L., and Wang, X., 2006, "Stress concentration at an elliptic hole in transversely isotropic piezoelectric solids," Int. J. Solids & Struct., 43, pp. 1818-1831.