Birefringence measurements of creep near an electrode tip in transparent PLZT

Journal of the European Ceramic Society

Volumn 29, Issue 11, 2009, Pages 2289-2296

  Liu, Q D ^a   Fleck, N A ^a   Huber, J E ^b   Chu, D P ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Birefringence; Creep; Ferroelectric

Indexed keywords

BIREFRINGENCE MEASUREMENTS; BULK CERAMICS; CREEP RESPONSE; DOMAIN GROWTH; ELECTRIC DISPLACEMENT; ELECTRODE TIP; FERROELECTRIC; FERROELECTRIC DOMAINS; PARTIAL SURFACES; PRINCIPAL STRAIN; RAPID SWITCHING; SPATIAL EVOLUTION; SURFACE ELECTRODE; TIME-DEPENDENT; UNIFORM ELECTRIC FIELDS;

CREEP; ELECTRIC FIELDS; FERROELECTRICITY; POLARIZATION; SPOT WELDING;

BIREFRINGENCE;

EID: 67349247812     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.01.008     Document Type: Article

References (17)

1. Traynor S.D., Sun S., and Hadnagy D. Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation. Integr. Ferroelectr. 16 (1997) 63-76
2. So Y.W., Kim D.J., Noh T.W., Yoon J.G., and Song T.K. Polarization-switching mechanisms for epitaxial ferroelectric Pb(Zr,Ti)O-3 films. J. Korean Phys. Soc. 46 (2005) 40-43
3. Janocha H., and Kuhnen K. Real-time compensation of hysteresis and creep in piezoelectric actuators. Sens. Actuators A: Phys. 79 (2000) 83-89
4. Zhou D., and Kamlah M. Determination of room temperature creep of soft lead zirconate titanate piezoceramics under static electric fields. J. Appl. Phys. 98 (2005) [Article 104107]
5. Liu Q.D., and Huber J.E. Creep in ferroelectrics due to unipolar electrical loading. J. Europ. Ceram. Soc. 29 (2006) 2799-2806
6. Belov A.Y., and Kreher W.S. Micromechanics of ferroelectrics: from domain walls to piezoceramic devices. Ferroelectrics 351 (2007) 79-87
7. Lucato S.L.D.E., Lupascu D.C., Kamlah M., Rodel J., and Lynch C.S. Constraint-induced crack initiation at electrode edges in piezoelectric ceramics. Acta Mater. 49 (2001) 2751-2759
8. 33) of piezoelectric layered thin film structures influenced by the top electrode size. Proc. 14th IEEE Int. Symp. Applic. Ferroelect.-ISAF-04 vol. 1 (2004) 7-10
9. Qiu W., Kang Y.-L., Qin Q.-H., Sun Q.-S., and Xu F.-Y. Study for multilayer piezoelectric composite structure as displacement actuator by Moire interferometry and infrared thermography experiments. Mater. Sci. Eng. A: Struct. Mater. Properties Microstruct. Process. 452 (2007) 228-234
10. ASTM-D4093-95. Standard Test Method for Photoelastic Measurements of Birefringence and Residual Strains in Transparent or Translucent Plastic materials. American Society for Testing and Materials, 2001.
11. Glazer A.M., Lewis J.G., and Kaminsky W. An automatic optical imaging system for birefringent media. Proc. R. Soc. Lond. A 452 (1996) 2751-2765
12. Keve E.T., and Bye K.L. Phase identification and domain structure in PLZT ceramics. J. Appl. Phys. 46 (1975) 810-818
13. Scott J.F. Ferroelectric Memories (2000), Springer
14. Ganpule C.S., Roytburd A.L., Nagarajan V., Hill B.K., Ogale S.B., Williams E.D., et al. Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films. Phys. Rev. B 65 (2001) [Article 014101]
15. Essam J.W. Percolation theory. Rep. Prog. Phys. 43 (1980) 833-912
16. Ivey M., and Bolie V.W. Birefringent light scattering in PLZT ceramics. IEEE Trans. Ultrason. Ferroelectr. Freq. Contr. 38 (1991) 579-584
17. Land C.E. Variable birefringence, light scattering and surface-deformation effects in PLZT ceramics. Ferroelectrics 7 (1974) 45-51