Ultrasensitive RDX detection with commercial SERS substrates

Journal of Raman Spectroscopy

Volumn 45, Issue 1, 2014, Pages 41-46

  Almaviva, S ^a   Botti, S ^a   Cantarini, L ^a   Fantoni, R ^a   Lecci, S ^a   Palucci, A ^a   Puiu, A ^a   Rufoloni, A ^a  

^a ENEA   (Italy)

Author keywords

explosives; Raman spectroscopy; SERS; trace evidence

Indexed keywords

EXPLOSIVES DETECTION; LIGHT TRANSMISSION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

ANALYTES; DIODE-LASER; LASER EMITTING; MICRO-RAMAN; RAMAN SPECTROSCOPY MEASUREMENTS; RAMAN SYSTEMS; SURFACE ENHANCED RAMAN SPECTROSCOPY; TABLE-TOP; TRACE EVIDENCES; ULTRASENSITIVE;

EXPLOSIVES;

EID: 84892519588     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.4413     Document Type: Article

References (25)

1. D. J. Gardiner, Practical Raman Spectroscopy. Springer-Verlag, Berlin, 1989.
2. D. L. Jeanmaire, R. P. Van Duyne, J. Electr. Chem. 1977, 84, 1.
3. A. Otto, [ Electronic Scattering, Spin Effects, SERS, and Morphic Effects (in Light Scattering in Solids Vol 4) ], Springer, Berlin 1984.
4. M. Fleischmann, P. J. Hendra, A. J. McQuillan, Chem. Phys. Lett. 1974, 26 (2), 163.
5. E. C. Le Ru, E. P. Etchegoin, Principles of Surface Enhanced Raman Spectroscopy and Related Plasmonic Effects, Elsevier, Amsterdam, 2009.
6. K. Kneipp, A. S. Haka, H. Kneipp, K. Badizadegan, N. Yoshizawa, C. Boone, K. E. Shafer-Peltier, J. T. Motz, R. R. Dasari, M. S. Feld, Appl. Spectrosc. 2002, 56, 150.
7. C. L. Haynes, A. D. McFarland, R. P. Van Duyne, Anal. Chem. 2005, 77, 338A.
8. N. M. B. Perney, F. J. García de Abajo, J. J. Baumberg, A. Tang, M. C. Netti, M. D. B. Charlton, M. E. Zoorob, Phys. Rev. B 2007, 76, 035426.
9. A. D. McFarland, M. A. Young, J. A. Dieringer, R. P. Van Duyne, J. Phys. Chem. B 2005, 109, 11279.
10. N. Félidj, J. Aubard, G. Lévi, Appl. Phys. Lett. 2003, 82, 3095.
11. J. Grand, S. Kostcheev, J. L. Bijeon, M. Lamy de la Chapelle, P. M. Adam, A. Rumyantseva, G. Lérondel, P. Royer, Synth. Met. 2003, 139, 621.
12. N. A. Hathab, G. Eres, P. B. Hatzinger, B. Gu, J. Raman. Spectrosc. 2010, 41, 1131.
13. S. Botti, S. Almaviva, L. Cantarini, A. Palucci, A. Puiu, A. Rufoloni, J. Raman. Spectrosc. 2013, 44, 463.
14. C. Lopez-Moreno, S. Palanco, J. J. Laserna, F. De Lucia, A. W. Miziolek, J. Rose, R. A. Walters, A. J. Whitehouse, J. Anal. At. Spectrom. 2006, 21, 55.
15. T.A. Alexander, D.M. Le, Appl. Opt. 2007, 46 (18), 3878.
16. M. E. Abdelsalam, P. N. Bartlett, J. J. Baumberg, T. A. Kelf, S. Cintra, A. E. Russell, Electrochem. Comm. 2005, 7, 740.
17. R. Davey, J. Garside, From Molecules to Crystallizers: An Introduction to Crystallization, Oxford University Press, Oxford, 2000.
18. http://rsb.info.nih.gov/ij/
19. I. R. Lewis, N. W. Daniel, P. P. Griffiths, App. Spect. 1997, 51 (12), 1854.
20. J. F. A. Calzzani, R. Sileshi, A. Kassu, J. M. Taguenang, A. Chowdhury, A. Sharma, P. B. Ruffin, C. Brantley, E. Edwards, SPIE 2008, 6945, 694510.
21. R. J. Karpowicz, T. B. Brill, J. Phys. Chem. 1984, 88, 348.
22. P. Torres, L. Mercado, I. Cotte, S. P. Hernandez, N. Mina, A. Santan, R. T. Chamberlain, R. Lareau, M. E. Castro, J. Phys. Chem. B 2004, 108, 8799.
23. N. W. Daniel Jr, I.R. Lewis, P. R. Griffiths, Appl. Spectrosc., 1997, 51, 1868.
24. K. C. Vernon, T. J. Davis, F. H. Scholes, D. E. Gomez, D. Lau, J. Raman Spectrosc. 2010, 41, 1106.
25. J. Li, X. Xu, Y. Wang, M. Wang, Z. Dong, W. Tian, J. Sun, C. Zhang, B. Wang, J. Raman Spectrosc. 2012, 43, 863.