Wavelength-scanned surface-enhanced Raman excitation spectroscopy

Journal of Physical Chemistry B

Volumn 109, Issue 22, 2005, Pages 11279-11285

  McFarland, Adam D ^a   Young, Matthew A ^a   Dieringer, Jon A ^a   Van Duyne, Richard P ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENZENETHIOL; LOCALIZED SURFACE PLASMON RESONANCE (LSPR); NANOPARTICLES; NANOSPHERE LITHOGRAPHY (NSL);

ADSORPTION; COLLOIDS; LITHOGRAPHY; MOLECULAR VIBRATIONS; NITROGEN COMPOUNDS; RAMAN SCATTERING; SILVER; SOLID STATE LASERS; SURFACE CHEMISTRY; SURFACE PLASMON RESONANCE; SURFACE ROUGHNESS;

RAMAN SPECTROSCOPY;

CYCLOHEXANE DERIVATIVE; MICROSPHERE; NANOPARTICLE; PHENOL DERIVATIVE; THIOL DERIVATIVE; THIOPHENOL;

ARTICLE; CHEMISTRY; ELECTROMAGNETIC FIELD; INSTRUMENTATION; METHODOLOGY; PHOTON; RAMAN SPECTROMETRY; SURFACE PROPERTY;

CYCLOHEXANES; ELECTROMAGNETIC FIELDS; MICROSPHERES; NANOPARTICLES; PHENOLS; PHOTONS; SPECTRUM ANALYSIS, RAMAN; SULFHYDRYL COMPOUNDS; SURFACE PROPERTIES;

EID: 20744435632     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp050508u     Document Type: Article

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