Scalable trace signal selection using machine learning

2013 IEEE 31st International Conference on Computer Design, ICCD 2013

Volumn , Issue , 2013, Pages 384-389

  Rahmani, Kamran ^a   Mishra, Prabhat ^a   Ray, Sandip ^b  

^a University of Florida   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

machine learning; Post silicon; signal selection

Indexed keywords

SILICON;

COMPUTATION OVERHEADS; MACHINE LEARNING TECHNIQUES; POST-SILICON; POST-SILICON VALIDATIONS; RESTORATION QUALITY; SELECTION TECHNIQUES; SIGNAL SELECTION; TRACE-SIGNAL SELECTION;

LEARNING SYSTEMS;

EID: 84892518916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2013.6657069     Document Type: Conference Paper

References (16)

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