A zoom into the nanoscale texture of secondary cell walls

Plant Methods

Volumn 10, Issue 1, 2014, Pages

  Keplinger, Tobias ^a,b   Konnerth, Johannes ^c   Aguié Béghin, Véronique ^d,e   Rüggeberg, Markus ^a,b   Gierlinger, Notburga ^a,b   Burgert, Ingo ^a,b  

^a ETH ZURICH   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c UNIVERSITY OF NATURAL RESOURCES AND LIFE SCIENCES   (Austria)

^d UMR614 FARE   (France)

^e UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

Atomic force microscopy; Diffraction limit; Lignification; Scanning near field optical microscopy; Secondary cell walls

Indexed keywords

FAGUS; PICEA;

EID: 84892394453     PISSN: None     EISSN: 17464811     Source Type: Journal    
DOI: 10.1186/1746-4811-10-1     Document Type: Article

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