Electrical characterization and microstructures of Ce-doped Bi 4Ti3O12 thin films

Key Engineering Materials

Volumn 591, Issue , 2014, Pages 200-203

  Mei, X A ^a   Chen, M ^a   Liu, J ^a   Liu, R F ^a  

^a HUNAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Bismuth titanate; Ferroelectric; Films

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRICITY; FILMS; PEROVSKITE; PULSED LASER DEPOSITION; SEMICONDUCTOR DOPING; THIN FILMS;

BI-LAYERED PEROVSKITE; BI4TI3O12 THIN FILMS; BISMUTH TITANATE; ELECTRICAL CHARACTERIZATION; FERROELECTRIC PROPERTY; PREFERRED ORIENTATIONS; PULSED-LASER DEPOSITION TECHNIQUE; RANDOM ORIENTATIONS;

CERIUM COMPOUNDS;

EID: 84891849808     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.591.200     Document Type: Conference Paper

References (10)

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