Assessment of a nanocrystal 3-D morphology by the analysis of single HAADF-HRSTEM images

Nanoscale Research Letters

Volumn 8, Issue 1, 2013, Pages 1-9

  Stroppa, Daniel G ^a,b,c   Righetto, Ricardo D ^a,c   Montoro, Luciano A ^a   Houben, Lothar ^b   Barthel, Juri ^b   Cordeiro, Marco A L ^d   Leite, Edson R ^d   Weng, Weihao ^e   Kiely, Christopher J ^e   Ramirez, Antonio J ^a,c  

^a BRAZILIAN CENTER FOR RESEARCH IN ENERGY AND MATERIALS CNPEM   (Brazil)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c UNIVERSITY OF CAMPINAS   (Brazil)

^d FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^e Lehigh University   (United States)

Author keywords

3 D morphology; HAADF; HRSTEM; Nanocrystal modeling

Indexed keywords

ATOMS; CERIUM OXIDE; GAUSSIAN DISTRIBUTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT;

CHARACTERIZATION PROCEDURES; CRYSTALLOGRAPHIC STRUCTURE; HAADF; HIGH RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPIES; HIGH-ANGLE ANNULAR DARK FIELDS; HRSTEM; MORPHOLOGICAL CHARACTERIZATION; MORPHOLOGICAL PARAMETERS;

MORPHOLOGY;

EID: 84891389796     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-8-475     Document Type: Article

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