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Volumn 1, Issue , 2003, Pages 342-343

Free-free beam silicon carbide nanomechanical resonators

Author keywords

Acoustic beams; Etching; Frequency; Lithography; Optical attenuators; Optical films; Optical resonators; Q factor; Resonance; Silicon carbide

Indexed keywords

ACOUSTIC RESONATORS; ACOUSTICS; ACTUATORS; ETCHING; LITHOGRAPHY; MICROSYSTEMS; OPTICAL FILMS; OPTICAL RESONATORS; Q FACTOR MEASUREMENT; RESONANCE; RESONATORS; SILICON; SILICON CARBIDE; TRANSDUCERS;

EID: 84891371651     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2003.1215323     Document Type: Conference Paper
Times cited : (12)

References (5)
  • 3
    • 79955996608 scopus 로고    scopus 로고
    • Balanced electronic detection of displacement in nanoelectromechanical systems
    • K. L. Ekinci, Y. T. Yang, X. M. H. Huang, & M. L. Roukes, "Balanced electronic detection of displacement in nanoelectromechanical systems", Appl. Phys. Lett., 81(12), 2253-2255 (2002).
    • (2002) Appl. Phys. Lett. , vol.81 , Issue.12 , pp. 2253-2255
    • Ekinci, K.L.1    Yang, Y.T.2    Huang, X.M.H.3    Roukes, M.L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.