Tuning the Interface Conductivity of LaAlO3/SrTiO3 Using Ion Beams: Implications for Patterning

ACS Nano

Volumn 7, Issue 12, 2013, Pages 10572-10581

  Mathew, Sinu ^a   Annadi, Anil ^a   Chan, Taw Kuei ^a   Asmara, Teguh Citra ^a   Zhan, Da ^b   Wang, Xiao Renshaw ^a,c   Azimi, Sara ^a   Shen, Zexiang ^b   Rusydi, Andrivo ^a   Ariando, ^a   Breese, Mark B H ^a   Venkatesan, T ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

heterointerface; interface conductivity; interface patterning; ion irradiation; localization; point defects; spectroscopic ellipsometry

Indexed keywords

CARRIER LOCALIZATION; FOCUSED-ION-BEAM WRITING; HETERO INTERFACES; INTERFACE CONDUCTIVITY; LOCALIZATION; MAGNETO-TRANSPORT MEASUREMENT; NANOMETER-SCALE PATTERNS; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS;

DEFECTS; ELECTRON GAS; GROUND STATE; ION BEAMS; ION BOMBARDMENT; LANTHANUM ALLOYS; OPTICAL CONDUCTIVITY; POINT DEFECTS; SPECTROSCOPIC ELLIPSOMETRY;

STRONTIUM TITANATES;

EID: 84891354028     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn4028135     Document Type: Article

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