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Volumn , Issue , 2013, Pages 193-196

A 65nm 4MB embedded flash macro for automotive achieving a read throughput of 5.7GB/s and a write throughput of 1.4MB/s

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE APPLICATIONS; EMBEDDED FLASH MEMORY; JUNCTION TEMPERATURES; MULTIPLEXER DESIGNS; SENSE AMPLIFIER; THROUGHPUT RATE; WRITE OPERATIONS; WRITE THROUGHPUTS;

EID: 84891070740     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIRC.2013.6649105     Document Type: Conference Paper
Times cited : (6)

References (7)
  • 2
    • 84864146326 scopus 로고    scopus 로고
    • Highly Reliable Flash Memory with Self-Aligned Split-Gate Cell Embedded into High Performance 65nm CMOS for Automotive & Smartcard Applications
    • D. Shum, et al., "Highly Reliable Flash Memory with Self-Aligned Split-Gate Cell Embedded into High Performance 65nm CMOS for Automotive & Smartcard Applications" in International Memory Workshop (IMW), 2012, pp. 139-142.
    • (2012) International Memory Workshop (IMW) , pp. 139-142
    • Shum, D.1
  • 6
    • 84891126378 scopus 로고    scopus 로고
    • Mar Rene-sas 32-Bit RISC Microcomputer SuperH RISC engine Family, Renesas
    • SH7256 Group Users Manual: Hardware Rev. 2. 00 Mar 2012 Rene-sas 32-Bit RISC Microcomputer SuperH RISC engine Family, Renesas, http://documentation. renesas. com/doc/products/mpumcu/doc/superh /r01uh0344ej0200 sh7256. pdf.
    • (2012) SH7256 Group Users Manual: Hardware Rev. 2. 00


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.