Microstructure and energy-storage performance of BaO-B2O 3-SiO2 glass added (Na0.5Bi0.5) TiO3 thick films

Journal of Materials Science: Materials in Electronics

Volumn 24, Issue 10, 2013, Pages 3830-3835

  Zhang, Le ^a   Hao, Xihong ^a   Zhang, Liwen ^a   Yang, Jichun ^a   An, Shengli ^a  

^a INNER MONGOLIA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA SUBSTRATES; BREAKDOWN STRENGTHS; GLASS ADDITION; LEAD-FREE; LOW-LEAKAGE CURRENT; SCREEN PRINTING METHODS; TIO;

ALUMINA; DIELECTRIC PROPERTIES; MICROSTRUCTURE; SODIUM; THICK FILMS;

GLASS;

EID: 84890122214     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-013-1325-9     Document Type: Article

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