Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART B, 2013, Pages 137-143

  Werner, Wolfgang S M ^a   Smekal, Werner ^a   Hisch, Thomas ^a   Himmelsbach, Julia ^a   Powell, Cedric J ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Electron transport; Nanomorphology; Nanostructures; Photoelectron spectra

Indexed keywords

ANGULAR AND ENERGY DISTRIBUTIONS; ELECTRON TRANSPORT; NANOMORPHOLOGIES; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; PHOTOELECTRON SPECTRUM; QUANTITATIVE INFORMATION; QUANTITATIVE INTERPRETATION; X RAY PHOTOELECTRON SPECTRA;

ANGULAR DISTRIBUTION; ELASTIC SCATTERING; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SURFACE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRONS;

EID: 84890115794     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.06.007     Document Type: Article

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