Calculation of layer thickness on nanotube surfaces from XPS intensity data

Surface and Interface Analysis

Volumn 44, Issue 8, 2012, Pages 1130-1134

  Mohai, M ^a   Bertoti I ^a  

^a CHEMICAL RESEARCH CENTER   (Hungary)

Author keywords

layer thickness; modified carbon nanotubes; quantification; XPS

Indexed keywords

BULK-LIKE; CONVEX SURFACES; CORE MATERIAL; COVALENT ATTACHMENT; CYLINDRICAL GEOMETRY; DRUG CARRIER; EFFECTIVE THICKNESS; HI-TECH; INTENSITY DATA; LAYER THICKNESS; MATERIAL SCIENCE; MODIFIED LAYER; NANO-OBJECTS; NANOTUBE SURFACE; OUTER SHELLS; PHYSICOCHEMICAL PROPERTY; POINT TO POINT; POLYMERIC MATRICES; QUANTIFICATION; REACTIVE SURFACES; REINFORCING COMPONENTS; XPS MEASUREMENTS;

CARBON NANOTUBES; COREMAKING; CYLINDERS (SHAPES); NANOTUBES; NITROGEN PLASMA; STRUCTURAL CERAMICS; TUBES (COMPONENTS);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84864439351     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4864     Document Type: Conference Paper

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