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Volumn 189, Issue SUPPL., 2013, Pages 24-29

Photoemission electron microscopy, a tool for plasmonics

Author keywords

Multiphoton absorption; PEEM; Photoemission electron microscopy; Plasmon

Indexed keywords

MULTI-PHOTON ABSORPTION; OPTICAL NEAR FIELD; PEEM; PHOTOEMISSION ELECTRON MICROSCOPY; PHOTOEMITTED ELECTRONS; PLASMON-POLARITONS; SPATIO-TEMPORAL DYNAMICS; SURFACE PLASMONS;

EID: 84888858307     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.03.013     Document Type: Article
Times cited : (21)

References (49)
  • 35
    • 85016956626 scopus 로고    scopus 로고
    • Ultrafast Optics Copyright© 2009, John Wiley & Sons, Inc. Print ISBN: 9780471415398, doi:10.1002/9780470473467, Series Editor(s): Glenn Boreman.
    • A.M. Weiner, Ultrafast Optics Copyright© 2009, John Wiley & Sons, Inc. Print ISBN: 9780471415398, doi:10.1002/9780470473467, Series Editor(s): Glenn Boreman.
    • Weiner, A.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.