High pressure single-crystal micro X-ray diffraction analysis with GSE-ADA/RSV software

High Pressure Research

Volumn 33, Issue 3, 2013, Pages 466-484

  Dera, Przemyslaw ^a,b   Zhuravlev, Kirill ^a   Prakapenka, Vitali ^a   Rivers, Mark L ^a   Finkelstein, Gregory J ^c   Grubor Urosevic, Ognjen ^d   Tschauner, Oliver ^d   Clark, Simon M ^e   Downs, Robert T ^f  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF HAWAII   (United States)

^c PRINCETON UNIVERSITY   (United States)

^d UNIVERSITY OF NEVADA   (United States)

^e MACQUARIE UNIVERSITY   (Australia)

^f UNIVERSITY OF ARIZONA   (United States)

Author keywords

Area detectors; Diamond anvil cell; High pressure; Single crystal X ray diffraction

Indexed keywords

AREA DETECTORS; ARGONNE NATIONAL LABORATORY; DIAMOND-ANVIL CELL; HIGH PRESSURE; HIGH-PRESSURE CONDITION; LAWRENCE BERKELEY NATIONAL LABORATORY; MICRO X RAY DIFFRACTION; SINGLE CRYSTAL X-RAY DIFFRACTION;

LIGHT SOURCES; TOOLS; X RAY DIFFRACTION ANALYSIS;

HIGH PRESSURE ENGINEERING;

EID: 84888347100     PISSN: 08957959     EISSN: 14772299     Source Type: Journal    
DOI: 10.1080/08957959.2013.806504     Document Type: Article

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