Use of a CCD diffractometer in crystal structure determinations at high pressure

Journal of Applied Crystallography

Volumn 37, Issue 3, 2004, Pages 410-416

  Dawson, Alice ^a   Allan, David R ^a   Parsons, Simon ^a   Ruf, Michael ^b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b BRUKER AXS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ARTICLE; CRYSTAL STRUCTURE; DIFFRACTION; GONIOMETRY; HYDROGEN BOND; ILLUMINATION; IMAGE ANALYSIS; LASER; LOW TEMPERATURE; MOLECULAR INTERACTION; PRESSURE; PRESSURE CHAMBER;

EID: 3442876420     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804007149     Document Type: Article

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