A compound control chart for monitoring and controlling high quality processes

European Journal of Operational Research

Volumn 233, Issue 3, 2014, Pages 595-603

  Bersimis, Sotiris ^a   Koutras, Markos V ^a   Maravelakis, Petros E ^a  

^a UNIVERSITY OF PIRAEUS   (Greece)

Author keywords

Applied probability; Conforming run length; High quality processes; Markov chain impedance; Quality control; Run length distribution

Indexed keywords

APPLIED PROBABILITY; COMPOUND CONTROL; CONFORMING RUN LENGTH; HIGH QUALITY; MONITORING AND CONTROLLING; NUMERICAL EXPERIMENTATIONS; OUT-OF-CONTROL; RUN LENGTH DISTRIBUTION;

MARKOV PROCESSES; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL;

FLOWCHARTING;

EID: 84888321109     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2013.08.017     Document Type: Article

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