Cumulative conformance count chart with variable sampling intervals and control limits

Applied Stochastic Models in Business and Industry

Volumn 27, Issue 4, 2011, Pages 410-420

  Chen, Yan Kwang ^a   Chen, Chien Yue ^b   Chiou, Kuo Ching ^c  

^a NATIONAL TAICHUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

average time to signal; cumulative conformance count; Markov chain; variable sampling interval and control limit

Indexed keywords

100% INSPECTION; AVERAGE TIME TO SIGNAL; CONTROL LIMITS; CUMULATIVE CONFORMANCE COUNT; INSPECTION COSTS; MARKOV CHAIN; MONITORING PROCESS; PERFORMANCE MEASURE; PROCESS CHANGE; SAMPLING INTERVAL; STATISTICAL EFFICIENCY; VARIABLE SAMPLING INTERVALS;

FLIP FLOP CIRCUITS; INSPECTION; MARKOV PROCESSES; SAMPLING; SIGNAL PROCESSING;

STATISTICAL PROCESS CONTROL;

EID: 80051733313     PISSN: 15241904     EISSN: 15264025     Source Type: Journal    
DOI: 10.1002/asmb.848     Document Type: Article

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