On the monitoring of multi-attributes high-quality production processes

Metrika

Volumn 66, Issue 3, 2007, Pages 373-388

  Akhavan Niaki, Seyed Taghi ^a   Abbasi, Babak ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Geometric control chart; High quality process; Multi attribute control charts; Multi attributes processes; Skewness reduction

Indexed keywords

EID: 34548253507     PISSN: 00261335     EISSN: 1435926X     Source Type: Journal    
DOI: 10.1007/s00184-006-0117-0     Document Type: Article

References (43)

1. Acosta-Mejia C (1999) Improved p charts to monitor process quality. IIE Trans 31:509-516
2. Box GEP, Cox DR (1964) An analysis of transformations. J Roy Stat Soc B 26:211-243
3. Cario MC, Nelson BL (1997) Modeling and generating random vectors with arbitrary marginal distributions and correlation matrix. Technical Report, Department of Industrial Engineering and Management Sciences, Northwestern University, USA
4. Collica RS, Ramirez JG, Taam W (1996) Process monitoring in integrated circuit fabrication using both yield and spatial statistics. Qual Reliab Engg Int 12:195-202
5. Consul PC (1989) Generalized Poisson distributions: properties and applications. Marcel Dekker
6. Gadre MP, Rattihalli RN (2005) Some group inspection based multi-attribute control charts to identify process deterioration. Econ Qual Contr 2:151-164
7. Gibra IN (1978) Economically Optimal Determination of the Parameters of np-Control Charts. J Qual Technol 10:12 -19
8. Glushkovsky EA (1994) On-line G-control chart for attribute data. Qual Reliab Engg Int 10: 217-227
9. Goh TN (1987) A control chart for very high yield processes. Qual Assuran 13:18-22
10. Hawkins DM (1991) Regression adjustment for variables in multivariate quality control. J Qual Technol 25:175-182
11. Hawkins DM, Olwell DH (1998) Cumulative sum charts and charting for quality improvements. Springer, Berlin Hidelberg New York, pp129-132
12. Hayter AJ, Tsui KL (1994) Identification and qualification in multivariate quality control problems. J Qual Technol 26:197-208
13. He B, Xie M, Goh TN, Tsui L (2002) Control charts based on generalized Poisson model for count data. Technical Report, Logistics Institute Georgia Tech. and Logistics Institute - Asia Pacific, National University of Singapore
14. Hotelling H (1947) Multivariate quality control. In: Eisenhart, Hastay, Wallis (eds) Techniques of statistical analysis. McGraw-Hill, New York
15. Jarque CM, Bera AK (1987) A test for normality of observations and regression residuals. Int Stat Rev 55:163-172
16. Jolayemi JK (2000) An optimal design of multi-attribute control charts for processes subject to a multiplicity of assignable causes. Appl Mathe Comput 114:187-203
17. Johnson NL, Kotz S (1969) Discrete distributions. Wiley, New York
18. Jolayemi JK (1994) Convolution of independent binomial variables: An approximation method and a comparative study. Comput Stat Data Analy 18:403-417
19. Kaminsky FC, Benneyan JC, Davis RD, Burke RJ (1992) Statistical control charts based on a geometric distribution. J Qual Technol 24:63-69
20. Kourti T, MacGregor JF (1996) Multivariate SPC methods for process and product monitoring. J Qual Technol 28:409-428
21. Kuralmani V, Xie M, Goh TN, Gan FF (2002) A conditional decision procedure for high yield processes. IIE Trans 34:1021-1030
22. Lambert D (1992) Zero-inflated regression with an application to defects in manufacturing. Technometrics, 34:1-14
23. Larpkiattaworn S (2003) A neural network approach for multi-attribute process control with comparison of two current techniques and guidelines for practical Use. Ph.D. Thesis, University of Pittsburgh, USA
24. Lowry CA, Montgomery DC (1995) A review of multivariate control charts. IIE Transa 27:800-810
25. Lu XS, Xie M, Goh TN, Lai CD (1998) Control chart for multivariate attribute processes. Int J Product Res 36:3477-3489
26. Marcucci M (1985) Monitoring multinomial processes. J Qual Technol 17:86-91
27. Montgomery DC (2003) Introduction to statistical quality control. 5th edn, J Wiley, New York
28. Nelson LS (1994) A control chart for parts-per-million nonconforming items. J Qual Technol 26:239-240
29. Niaki STA, Abbasi B (2006) A symmetric rectangular region for multi-attribute C control chart. In: Proceedings of the 36th international conference on computer and industrial engineering, Taipei, Taiwan
30. Niaki STA, Abbasi B (2005) Fault diagnosis in multivariate control charts using artificial neural networks. J Qual Reliab Engg Int 21:825-840
31. Niaki STA, Abbasi B (2006) NORTA and neural networks based method to generate random vectors with arbitrary marginal distributions and correlation matrix. In: Proceedings of the 17th IASTED international conference on modeling and simulation, Montreal, Canada
32. Patel HI (1973) Quality control methods for multivariate binomial and Poisson distributions. Technometrics, 15:103-112
33. Quesenberry CP (1995) Geometric Q-charts for high quality processes. J Qual Technol 27:304-315
34. Runger GC (1996) Projections and the U2 multivariate control chart. J Qual Technol 2:313-319
35. Ryan TP (1989) Statistical methods for quality improvement. J Wiley, New York
36. Ryan TP, Schwertman NC (1997) Optimal limits for attributes control charts. J Qual Technol 29:86-96
37. Thisted RA (2000) Elements of statistical computing, numerical computation. Chapman & Hall/CRC, Boca Raton
38. Woodall WH (1997) Control charts based on attribute data: Bibliography and review. J Qual Technol 29:172-183
39. Xie M, Goh TN, Tang Y (2000) Data transformation for geometrically distributed quality characteristics. Qual Reliab Engg Int 16:9-15
40. Xie M, Goh TN (1993) SPC of a near zero-defect process subject to random shock. Qual Reliabi Engg Int 9:89-93
41. Xie M, Goh TN (1995) Some procedures for decision making in controlling high yield processes. Qual Reliabi Engg Int 8:355-360
42. Xie M, Goh TN (1997) The use of probability limits for process control based on geometric distribution. Int J Qual Relia Manage 14:64-73
43. Yang ZH, Xie M, Kuralmani V, Tsui K (2002) On the performance of geometric charts with estimated control limits. J Qual Technolo 34:448-458