Design of the sum-of-conforming-run-length control charts

European Journal of Operational Research

Volumn 132, Issue 1, 2001, Pages 187-196

  Wu, Zhang ^a   Zhang, Xiaolan ^a   Yeo, Song Huat ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Average time to signal; Quality; Random shift model; SCRL control chart

Indexed keywords

MATHEMATICAL MODELS; QUALITY CONTROL; RANDOM PROCESSES; STATISTICAL PROCESS CONTROL;

RANDOM-SHIFT MODELS;

OPERATIONS RESEARCH;

EID: 0035401217     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0377-2217(00)00131-4     Document Type: Article

References (18)

1. Modeling discrete data in SPC: The g and h charts
2. Detecting a shift in fraction nonconforming using run-length control charts with 100% inspection
3. Quality control techniques for zero defects
4. The economic design of p-charts to maintain current control of a process: Some numerical results
5. On-line G-control chart for attribute data
6. A control chart for very high yield processes
7. Statistical control charts based on a geometric distribution
8. Control charts applicable when the fraction nonconforming is small
9. A control chart for parts-per-million nonconforming items
10. CUSUM chart with variable sampling intervals
11. Control charts based on attribute data: Bibliography and review
12. Evaluation of ATS for CRL control chart
13. A comparative study of CCC and CUSUM charts
14. A Shewhart-like charting technique for high yield processes
15. ACRL chart - An effective SPC tool for attributes