EnBay: A novel pattern-based Bayesian classifier

IEEE Transactions on Knowledge and Data Engineering

Volumn 25, Issue 12, 2013, Pages 2780-2795

  Baralis, Elena ^a   Cagliero, Luca ^a   Garza, Paolo ^b  

^a POLITECNICO DI TORINO   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

And association rules; Classification; Clustering; Data mining

Indexed keywords

BAYESIAN CLASSIFICATION; BAYESIAN CLASSIFIER; BAYESIAN PROBABILITIES; CLUSTERING; EFFECTIVE APPROACHES; EXPERIMENTAL EVALUATION; OVERLAPPED PATTERNS; SYNTHETIC DATASETS;

CLASSIFICATION (OF INFORMATION); DATA MINING; ENTROPY;

STATISTICAL TESTS;

EID: 84887934390     PISSN: 10414347     EISSN: None     Source Type: Journal    
DOI: 10.1109/TKDE.2012.197     Document Type: Article

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