RHEED and XPS study of cerium interaction with SnO2 (110) surface

Ceramics International

Volumn 40, Issue 1 PART A, 2014, Pages 323-329

  Beran, J ^a,b   Hishita, S ^b   Masek K ^a   Matolin V ^a   Haneda, H ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

A. Grain growth; B. Spectroscopy

Indexed keywords

ATOMS; GRAIN GROWTH; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TIN DIOXIDE; TIN OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

CORE-LEVEL SPECTRA; CRYSTALLOGRAPHIC PLANE; EPITAXIAL GRAINS; MULTI-LAYER SYSTEM; NON-STOICHIOMETRIC; STRONG INTERACTION; SURFACE ORIENTATION; THIN EPITAXIAL FILMS;

CERIUM OXIDE;

EID: 84887625702     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2013.06.005     Document Type: Article

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