Dual-beam versus single-beam depth profiling: Same sample in same instrument

Rapid Communications in Mass Spectrometry

Volumn 27, Issue 24, 2013, Pages 2828-2832

  Baryshev, S V ^a,c   Becker, N G ^a,b   Zinovev, A V ^a   Tripa, C E ^a   Veryovkin, I V ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

^c EUCLID TECHLABS LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DEPTH; DUAL-BEAM; SINGLE-BEAM;

DEPTH PROFILING;

EID: 84887477778     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.6749     Document Type: Letter

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