CMOS pixels directly sensitive to both visible and near-infrared radiation

IEEE Transactions on Electron Devices

Volumn 60, Issue 5, 2013, Pages 1695-1700

  Langfelder, Giacomo ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

CMOS sensors; Color imaging; Computational imaging; Infrared imaging

Indexed keywords

CMOS SENSORS; COLOR IMAGING; COMPUTATIONAL IMAGING; FINITE ELEMENT SIMULATIONS; RADIATION ABSORPTION; SENSOR RESOLUTION; TRANSVERSE FIELD DETECTORS; VISIBLE AND NEAR INFRARED;

CMOS INTEGRATED CIRCUITS; INFRARED DEVICES; INFRARED IMAGING; INFRARED RADIATION; THERMOGRAPHY (IMAGING); TOPOLOGY;

PIXELS;

EID: 84887036748     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2255056     Document Type: Article

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