Small-size microlens characterization by multiwavelength high-resolution interference microscopy

Optics Express

Volumn 18, Issue 14, 2010, Pages 14319-14329

  Kim, Myun Sik ^a   Scharf, Toralf ^a   Herzig, Hans Peter ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION;

FABRICATION AND CHARACTERIZATIONS; HIGH RESOLUTION; INTERFERENCE MICROSCOPY; MICRO-LENS; MULTIWAVELENGTH; TEST TECHNIQUES; VISIBLE WAVELENGTHS;

MICROLENSES;

EID: 84886949845     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.014319     Document Type: Article

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