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Volumn 2, Issue 4, 2006, Pages 337-350

High resolution interference microscopy: A tool for probing optical waves in the far-field on a nanometric length scale

Author keywords

Diffraction; Interferometry; Nano optic; Super resolution

Indexed keywords

COMPUTER GENERATED HOLOGRAPHY; DIFFRACTION GRATINGS; ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVES; MICROLENSES; NANOSTRUCTURED MATERIALS;

EID: 33750714420     PISSN: 15734137     EISSN: None     Source Type: Journal    
DOI: 10.2174/157341306778699383     Document Type: Review
Times cited : (36)

References (45)
  • 11
    • 0003434416 scopus 로고
    • University Science Books, Mill Valey, California
    • Siegman, A. E. Lasers, University Science Books, Mill Valey, California, 1986.
    • (1986) Lasers
    • Siegman, A.E.1
  • 20
    • 0041967046 scopus 로고    scopus 로고
    • Grier, D. G. Nature, 2003, 424, 810.
    • (2003) Nature , vol.424 , pp. 810
    • Grier, D.G.1
  • 42
    • 0003972070 scopus 로고    scopus 로고
    • Cambridge University Press, Cambridge, UK
    • Born, M. and Wolf E., Principles of Optics, Cambridge University Press, Cambridge, UK, 1999.
    • (1999) Principles of Optics
    • Born, M.1    Wolf, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.