Amplitude and phase measurements of highly focused light in optical data storage systems

Japanese Journal of Applied Physics

Volumn 49, Issue 8 PART 3, 2010, Pages

  Kim, Myun Sik ^a   Scharf, Toralf ^a   Herzig, Hans Peter ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AIRY PATTERNS; DIGITAL VERSATILE DISC; FOCAL PLANE; FOCUSED BEAMS; FUTURE GENERATIONS; HIGH DEFINITION; HIGH RESOLUTION; INTENSITY MEASUREMENTS; INTERFERENCE MICROSCOPY; LIGHT BEAM; LIGHT FIELDS; MEASUREMENT TECHNIQUES; NON DESTRUCTIVE; OPTICAL DATA STORAGE SYSTEMS; OPTICAL DISCS; OPTICAL MEMORY; PHASE DISTRIBUTION; PHASE SINGULARITIES; SCANNING TECHNIQUES; SPOT SIZES; STORAGE MECHANISM; SUPER RESOLUTION; THREE-DIMENSIONAL (3D) MEASUREMENTS; WAVEFRONT PROPAGATION;

OPTICAL DATA PROCESSING; PHASE MEASUREMENT; THREE DIMENSIONAL; WAVEFRONTS;

OPTICAL DATA STORAGE;

EID: 78049343638     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.08KA03     Document Type: Conference Paper

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