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Journal of Electron Spectroscopy and Related Phenomena

Volumn 188, Issue , 2013, Pages 161-165

In situ hard x-ray quick rixs to probe dynamic changes in the electronic structure of functional materials

(7) Szlachetko, J a,b Sa J a Safonova, O V a Smolentsev, G a Szlachetko, M a Van Bokhoven, J A a,c Nachtegaal, M a

a PAUL SCHERRER INSTITUTE (Switzerland)

b JAN KOCHANOWSKI UNIVERSITY (Poland)

c Institute for Chemical and Bioengineering (Switzerland)

Author keywords

In situ; Quick rixs; Rixs; Time resolved; Xas; Xes

Indexed keywords

ELECTRONIC STATES; FUNCTIONAL MATERIALS; REACTION INTERMEDIATES; SPECTROMETERS; WAVELENGTH DISPERSIVE SPECTROSCOPY; XENON;

DYNAMIC CHANGES; ELECTRONIC CHANGES; OPERATIONAL CHARACTERISTICS; QUICK RIXS; RIXS; SITU CONDITIONS; TIME-RESOLVED; WAVELENGTH DISPERSIVE SPECTROMETERS;

ELECTRONIC STRUCTURE;

EID: 84886419617 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.11.002 Document Type: Article

Times cited : (29)

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