Modeling of an ion source lens system for sensitivity enhancement in a non-scanning linear ion trap

International Journal of Mass Spectrometry

Volumn 353, Issue , 2013, Pages 36-41

  Brkić, Boris ^a   Giannoukos, Stamatios ^a   France, Neil ^b   Janulyte, Aurika ^c   Zerega, Yves ^c   Taylor, Stephen ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b Q Technologies Ltd   (United Kingdom)

^c AIX MARSEILLE UNIVERSITY   (France)

Author keywords

Field analysis; Linear ion trap; Numerical modeling; Portable mass spectrometer; Sensitivity enhancement

Indexed keywords

EID: 84885956072     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2013.04.028     Document Type: Article

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