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Volumn 73, Issue 1, 2006, Pages

High-fidelity simulations of ion trajectories in miniature ion traps using the boundary-element method

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; COMPUTER SIMULATION; MATHEMATICAL MODELS; THERMAL NOISE;

EID: 33144482148     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.73.012326     Document Type: Article
Times cited : (20)

References (30)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.