Volcanic glass under fire - A comparison of three complementary analytical methods

X-Ray Spectrometry

Volumn 42, Issue 6, 2013, Pages 412-422

  Eder, Fabienne M ^a,b   Neelmeijer, Christian ^b   Pearce, Nicholas J G ^c   Bichler, Max ^a   Sterba, Johannes H ^a   Ntaflos, Theodoros ^d   Merchel, Silke ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^c ABERYSTWYTH UNIVERSITY   (United Kingdom)

^d UNIVERSITY OF VIENNA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITS; GAMMA RAYS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ION BEAMS; LASER ABLATION; MASS SPECTROMETERS;

ANALYTICAL METHOD; ANALYTICAL RESULTS; CHEMICAL COMPOSITIONS; CHEMICAL FINGERPRINT; GAMMA-RAY EMISSION; ION BEAM ANALYSIS; LASER-ABLATION INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY; NEUTRON-ACTIVATION ANALYSIS; PARTICLE INDUCED X-RAY EMISSION; VOLCANIC GLASS;

GLASS;

EID: 84885916877     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.2493     Document Type: Article

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