BAM-S005 Type A and B: New Silicate Reference Glasses for Microanalysis

Geostandards and Geoanalytical Research

Volumn 36, Issue 3, 2012, Pages 301-313

  Yang, Qi Chao ^a   Jochum, Klaus Peter ^a   Stoll, Brigitte ^a   Weis, Ulrike ^a   Kuzmin, Dmitry ^a,b   Wiedenbeck, Michael ^c   Traub, Heike ^d   Andreae, Meinrat O ^a  

^a MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

^b SOBOLEV INSTITUTE OF GEOLOGY AND MINERALOGY   (Russian Federation)

^c GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

^d BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

BAM S005; Characterisation; Homogeneity; Microanalysis; Reference glasses

Indexed keywords

BAM-S005; CERTIFIED VALUES; CHARACTERISATION; GERMANY; HOMOGENEITY; INFORMATION VALUE; LA-ICP-MS; MAJOR ELEMENTS; MATERIALS RESEARCH; MICRO-ANALYTICAL TECHNIQUES; REFERENCE GLASS; UNCERTAINTY LIMITS;

CESIUM; LEAD; MASS SPECTROMETERS; MATERIALS TESTING; MICROANALYSIS; SILICATES;

GLASS;

EID: 84865766173     PISSN: 16394488     EISSN: 1751908X     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2012.00171.x     Document Type: Article

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