Nitridation temperature effects on electronic and chemical properties of (Ga1-xZnx)(N1- xOx) solid solution nanocrystals

Journal of Physical Chemistry C

Volumn 117, Issue 39, 2013, Pages 20332-20342

  Ward, Matthew James ^a,c   Han, Wei Qiang ^b,d   Sham, Tsun Kong ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c Cornell University ^*  (United States)

^d NINGBO INSTITUTE OF MATERIALS TECHNOLOGY AND ENGINEERING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X-RAY ABSORPTION FINE STRUCTURES; NITRIDATION TEMPERATURE; OXIDE SOLID SOLUTION; PHOTOCATALYTIC ACTIVITIES; SURFACE OXIDE FORMATION; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY EXCITED OPTICAL LUMINESCENCE;

ABSORPTION SPECTRA; CHEMICAL PROPERTIES; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GALLIUM NITRIDE; NANOCRYSTALS; NITRIDATION; PHASE SEPARATION; PHOTOCATALYSTS; SOLID SOLUTIONS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

ZINC OXIDE;

EID: 84885115220     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp406990n     Document Type: Article

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