Distribution of glass transition temperature in multilayered poly(methyl methacrylate) thin film supported on a Si substrate as studied by neutron reflectivity

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 88, Issue 3, 2013, Pages

  Inoue, Rintaro ^a   Nakamura, Makoto ^a   Matsui, Kazuya ^a   Kanaya, Toshiji ^a   Nishida, Koji ^a   Hino, Masahiro ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH DISTRIBUTION; INTERFACIAL EFFECTS; NEUTRON REFLECTIVITY; POLY(METHYL METHACRYLATE) (PMMA) THIN FILM; POLYMER THIN FILMS; POLYSTYRENE THIN FILMS; SILICON SUBSTRATES; THICKNESS DEPENDENCE;

ESTERS; FILM THICKNESS; GLASS; POLYMERS; REFLECTION; THIN FILMS;

POLYMETHYL METHACRYLATES;

EID: 84885090152     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.88.032601     Document Type: Article

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